烧入周期英文解释翻译、烧入周期的近义词、反义词、例句
英语翻译：
【电】 burn-in period
分词翻译：
烧的英语翻译：
bake; burn; burning; carbonado; cook; cremation; fever; grill; heat; roast
set sth. on fire
【化】 burning
入的英语翻译：
agree with; enter; income; join
周期的英语翻译：
cycle; period; wheel
【计】 C; cycle time; loop cycle; periods
【化】 period
【医】 cycle
【经】 cycle; period
网络扩展解释
烧入周期（shāo rù zhōu qī）
烧入周期是指在半导体生产过程中，在高温条件下，将电子元件和元器件进行烧入操作的时间周期。
English Translation and Explanation
The English translation for "烧入周期" is "burn-in period". It refers to the time period during semiconductor production where electronic components and devices undergo a burn-in operation under high temperatures.
English Pronunciation
Burn-in period [bɜrn-ɪn ˈpɪəriəd]
English Usage
The burn-in period is an important step in semiconductor production to ensure the reliability and functionality of electronic components. It involves subjecting the components to elevated temperatures and operating conditions to identify any potential issues or weaknesses before they are deployed or sold.
English Example Sentences
1. The burn-in period for these microchips is 48 hours at 85 degrees Celsius.
（这些微芯片的烧入周期为85摄氏度下的48小时。）
2. During the burn-in period, the electronic devices are continuously tested to ensure their performance and stability.
（在烧入周期内，电子设备将持续进行测试，以确保其性能和稳定性。）
English Synonyms
1. Thermal stressing period: A period of subjecting electronic components to high temperatures for testing and evaluation.
（热应力周期：暴露电子元件于高温下进行测试和评估的周期。）
2. Aging period: A period of artificially accelerating the aging process of electronic components to identify potential failures and reliability issues.
（老化周期：人为加速电子元件老化过程，以识别潜在故障和可靠性问题的过程。）
English Antonyms
1. Testing period: A period where electronic components undergo functional or performance testing, typically conducted before the burn-in period.
（测试周期：电子元件在烧入周期之前进行功能或性能测试的周期。）
2. Manufacturing period: A period where electronic components are being produced or assembled, prior to any testing or burn-in procedures.
（制造周期：电子元件在进行任何测试或烧入操作之前进行生产或组装的周期。）
Frequency of Usage of the English Term
The term "burn-in period" is commonly used in the field of semiconductor technology and electronics manufacturing. It is frequently encountered in technical documents, research papers, and discussions related to semiconductor testing and reliability.
（"burn-in period"这个词汇在半导体技术和电子制造领域经常使用，在涉及半导体测试和可靠性的技术文件、研究论文和讨论中经常出现。）